Atomic force microscopy

Frae Wikipedia, the free beuk o knawledge
An atomic force microscope on the left wi controllin computer on the richt.

Atomic force microscopy (AFM) or scannin force microscopy (SFM) is a very heich-resolution type o scannin probe microscopy, wi demonstrated resolution on the order o fractions o a nanometer, mair nor 1000 times better nor the optical diffraction leemit.